年度 | 2018 |
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全部作者 | 蔡春进,Bo-Xi Liao, Neng-Chun Tseng, Ziyi Li, Yingshu Liu, Jen-Kun Chen, Chuen-Jinn Tsai* |
论文名称 | Exposure Assessment of Process By-product Nanoparticles Released during the Preventive Maintenance of Semiconductor Fabrication Facilities |
期刊名称 | Journal of Nanoparticle Research |
卷数 | 20 (7) |
页码 | 203- |
语言 | 英文 |