年度 | 2018 |
---|---|
全部作者 | 蔡春進,Bo-Xi Liao, Neng-Chun Tseng, Ziyi Li, Yingshu Liu, Jen-Kun Chen, Chuen-Jinn Tsai* |
論文名稱 | Exposure Assessment of Process By-product Nanoparticles Released during the Preventive Maintenance of Semiconductor Fabrication Facilities |
期刊名稱 | Journal of Nanoparticle Research |
卷數 | 20 (7) |
頁碼 | 203- |
語言 | 英文 |